Scanning Electron Microscope

Main Function:

  • Magnification : 150,000X
  • Automatic five-axis electric platform(X.Y.R.Z.T)
  • Built-in optical microscope
  • Provide high vacuum and low vacuum mode
  • Paired with secondary electrons (SE) and backscattered electrons (BSE)
  • Dual memory with position and analysis conditions



Easy operation interface (Chinese and English interface)


Automatic five-axis electric platform Tilting -45˚ to 90˚ degree


BSE+SE Mixed image