SNE-4500M PLUS

Scanning Electron Microscope


Main Function:

  • Magnification : 150,000X
  • Automatic five-axis electric platform(X.Y.R.Z.T)
  • Built-in optical microscope
  • Provide high vacuum and low vacuum mode
  • Paired with secondary electrons (SE) and backscattered electrons (BSE)
  • Dual memory with position and analysis conditions

 

 

Easy operation interface (Chinese and English interface)

 

 
 
Automatic five-axis electric platform Tilting -45˚ to 90˚ degree

 

BSE+SE Mixed image