SNE-3200M

Scanning Electron Microscope


Main Function:

  • Magnification : 60,000X
  • Manual three-axis(X、Y、R=360度旋轉載台)
  • Acceleration voltage : high vacuum and low vacuum mode
  • Paired with secondary electrons and backscattered electrons
  • Provide high vacuum and low vacuum mode

 

 

Easy operation interface (Chinese and English interface)

 

SE (Secondary Electron)

 

BSE(BackScattered Electron)

 

BSE+SE Mixed image