EDS System

Scanning Electron Microscope


Main Function:

  • Xi migrating energy spread mass spectrometer:

          SDD(Silicon Drift Detector)LN free

  • Energy resolution:Mn Kα ≤ 129 eV
  • Detector working area:30mm2
  • Element detection range:B(5)~Am(95)
  • Elemental Mapping & Line Scan

          Support PC with OS Windows system.