Model 1061 SEM Mill

Ion Beam Preparation

Main Function:

  • Dual ion gun that independently adjusts energy and polishing angle
  • Cross-section polishing and flat polishing
  • Argon ion gun energy range from 100eV to 10kV
  • One-button fully automated operation, operating parameters can be stored
  • Instant image observation process of sample thinning
  • Easy to operate and easy to maintain


Ion milling (surface cleaning) and EBSD sample preparation







Sample stage automatic height detection(eucentric point)



Cross-Section polishing




Cross-section station  




Easy operation interface