Model 1061 SEM Mill

Ion Beam Preparation


Main Function:

  • Dual ion gun that independently adjusts energy and polishing angle
  • Cross-section polishing and flat polishing
  • Argon ion gun energy range from 100eV to 10kV
  • One-button fully automated operation, operating parameters can be stored
  • Instant image observation process of sample thinning
  • Easy to operate and easy to maintain

 

Ion milling (surface cleaning) and EBSD sample preparation

 

 

 

 

 

 

Sample stage automatic height detection(eucentric point)

 

 

Cross-Section polishing

 

 

 

Cross-section station  

 

 

 

Easy operation interface